ULTRASONIC SURFACE VIBRATION INVESTIGATION BY ATOMIC-FORCE MICROSCOPY

This study presents a novel method to Study ultrasonic surface vibrati ons and ultrasound influence on the surface topography image obtained by atomic force microscope (AFM). The vibrations of piezoelectric plat e in the frequency range of 10-200 kHz were investigated. The experime nts show the possibility of using the AFM for the detection of acousti c waves and the measurement of the amplitude of vibrations and the dis tribution of electric field in a piezoplate. Influence of the ultrason ic surface vibrations on AFM tip-surface interaction was noticed. Late ral surface vibrations reduced the tip-surface adhesion down to zero. Experimental results show that the AFM cantilever in the presence of v ibrations has a lateral vibration mode coupled with a normal vibration mode. It increased the contrast of an image obtained in the lateral f orce mode. (C) 1998 Elsevier Science B.V.