MINORITY-CARRIER LIFETIME MEASUREMENTS IN EPITAXIAL SILICON LAYERS

Authors
HARA T TAMURA F KITAMURA T
Citation
T. Hara et al., MINORITY-CARRIER LIFETIME MEASUREMENTS IN EPITAXIAL SILICON LAYERS, Journal of the Electrochemical Society, 145(6), 1998, pp. 2205-2205
Citations number
15
Categorie Soggetti
Electrochemistry,"Materials Science, Coatings & Films
Journal title
Journal of the Electrochemical Society → ACNP
ISSN journal
00134651
Volume
145
Issue
6
Year of publication
1998
Pages
2205 - 2205
Database
ISI
SICI code
0013-4651(1998)145:6<2205:MLMIES>2.0.ZU;2-E