NONINVASIVE MEASUREMENT OF ELECTROSTATIC-DISCHARGE-INDUCED PHENOMENA IN ELECTRONIC SYSTEMS

The design of a high-speed measurement system consisting of an electri c (E)-field detector and a magnetic (H)-field detector coupled to an o ptoelectronic transmission system is described. A laser diode transmit ter, a fiber-optic link, and a laser diode receiver were used to isola te the detected signal from a high-speed transient digitizer, which wa s utilized to acquire experimental data for signal processing, Experim ents were conducted to measure E- and H-field-induced signal within a typical electronic enclosure subjected to radiated interference from a spark-gap source. The results have application in the development of an integrated electromagnetic interference (EMI) detector for use in e lectronic systems.