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ITA
ENG
NORMAL AND INVERTED MEYER-NELDEL RULE IN HOT-WIRE CVD DEPOSITED NANOCRYSTALLINE SILICON
Authors
BRUGGEMANN R
ROJAHN M
ROSCH M
Citation
R. Bruggemann et al., NORMAL AND INVERTED MEYER-NELDEL RULE IN HOT-WIRE CVD DEPOSITED NANOCRYSTALLINE SILICON, Physica status solidi. a, Applied research, 166(2), 1998, pp. 11-12
Citations number
10
Categorie Soggetti
Physics, Condensed Matter
Journal title
Physica status solidi. a, Applied research
→
ACNP
ISSN journal
00318965
Volume
166
Issue
2
Year of publication
1998
Pages
11 - 12
Database
ISI
SICI code
0031-8965(1998)166:2<11:NAIMRI>2.0.ZU;2-G