REALIZATION AND CHARACTERIZATION OF SI NANOSTRUCTURES

Citation
G. Groos et M. Stutzmann, REALIZATION AND CHARACTERIZATION OF SI NANOSTRUCTURES, Physica status solidi. a, Applied research, 166(2), 1998, pp. 687-693
Citations number
8
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
00318965
Volume
166
Issue
2
Year of publication
1998
Pages
687 - 693
Database
ISI
SICI code
0031-8965(1998)166:2<687:RACOSN>2.0.ZU;2-M
Abstract
Laser interference patterning can be used to produce periodic silicon structures from amorphous silicon films. We demonstrate that periods d own to 210 nm and structure sizes less than 100 nm can be realized. We examine film agglomeration as a way for direct laser patterning witho ut etching. The capability of the method to produce different morpholo gies is investigated. An analytical two-dimensional thermal calculatio n is compared with the experimentally observed sizes to understand the physical limits of the process. As an extension of the method, an oxi dation step is shown to reduce the lateral dimensions of stripes witho ut interrupting them. The results indicate possible processes for the production of yet smaller structures and for the use of these films as etching masks.