A STUDY OF X-RAY RESIDUAL-STRESS GRADIENT ANALYSIS IN THIN-LAYERS WITH STRONG FIBER TEXTURE - II - EXAMPLES

Citation
C. Genzel et W. Reimers, A STUDY OF X-RAY RESIDUAL-STRESS GRADIENT ANALYSIS IN THIN-LAYERS WITH STRONG FIBER TEXTURE - II - EXAMPLES, Physica status solidi. a, Applied research, 166(2), 1998, pp. 751-762
Citations number
30
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
00318965
Volume
166
Issue
2
Year of publication
1998
Pages
751 - 762
Database
ISI
SICI code
0031-8965(1998)166:2<751:ASOXRG>2.0.ZU;2-J
Abstract
The mechanical properties of thin hard coatings like resistance to abr asive wear are known to depend strongly on the texture as well as on t he distribution of the residual stresses over the layer thickness. The analysis of these stresses in thin coatings by means of X-ray diffrac tion, however, is rather difficult because the diffraction volume rema ins small in many cases and the stress fields are often superimposed b y gradients of the texture and/or the chemical composition. By the exa mple of PVD Ti1-xCrxN coatings with pronounced (111) fibre texture, we compare several methods in X-ray stress analysis with respect to thei r suitability for the detection of non-uniform residual stress distrib utions. The best results are obtained by means of the scattering vecto r method, where the depth profiles of the lattice spacings, d(phi psi) (hkl,tau), are measured at fixed positions (phi,psi) with respect to t he sample reference system after stepwise rotation of the sample aroun d the scattering vector g(phi psi).