THE MEASUREMENT OF RELATIVE COMPLEX DIELECTRIC-CONSTANT BY MEANS OF AN AUTOMATIC SLOTTED-LINE SYSTEM

Authors
LIN ZS LIN HT WU HX PAN CH LONG YL
Citation
Zs. Lin et al., THE MEASUREMENT OF RELATIVE COMPLEX DIELECTRIC-CONSTANT BY MEANS OF AN AUTOMATIC SLOTTED-LINE SYSTEM, International journal of infrared and millimeter waves, 19(5), 1998, pp. 755-769
Citations number
3
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied",Optics
Journal title
International journal of infrared and millimeter waves → ACNP
ISSN journal
01959271
Volume
19
Issue
5
Year of publication
1998
Pages
755 - 769
Database
ISI
SICI code
0195-9271(1998)19:5<755:TMORCD>2.0.ZU;2-1
Abstract
This paper reports the measurement of relative complex dielectric cons tant of lost dielectric, by means of an automatic slotted-line system controlled with micro-computer IBM 80486 and by use of numerical metho d. The measuring principle, method, program and results are given. The measuring results shows that the way mentioned in this paper is succe ssful, so it can be extended to MM-Wave band and other microwave band.