HIGH-RESOLUTION LEED PROFILE ANALYSIS AND DIFFUSION BARRIER ESTIMATION FOR SUBMONOLAYER HOMOEPITAXY OF AG AG(100)/

Citation
L. Bardotti et al., HIGH-RESOLUTION LEED PROFILE ANALYSIS AND DIFFUSION BARRIER ESTIMATION FOR SUBMONOLAYER HOMOEPITAXY OF AG AG(100)/, Physical review. B, Condensed matter, 57(19), 1998, pp. 12544-12549
Citations number
35
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
01631829
Volume
57
Issue
19
Year of publication
1998
Pages
12544 - 12549
Database
ISI
SICI code
0163-1829(1998)57:19<12544:HLPAAD>2.0.ZU;2-P
Abstract
We present a high-resolution low-energy electron diffraction study of two-dimensional island distributions formed by depositing 0.3 ML of Ag on Ag(100). The substrate temperature ranged between 170 and 295 K. F rom the ring structure or ''splitting'' of the diffraction profiles, w e determine the behavior of the spatial correlation length characteriz ing the island distribution. The precise relationship between this cor relation length and the mean island separation is also determined via an analysis of kinematic diffraction from island distributions in a re alistic model of nucleation and growth. Resulting estimates of this se paration are consistent with those based on results from a previous sc anning tunneling microscopy study at 295 K. From the Arrhenius behavio r of the correlation length, we estimate a terrace diffusion barrier f or Ag on AE(100) of 0.40 +/- 0.04 eV, with a vibrational prefactor of about 3 X 10(13) s(-1).