A. Rosenfeld et al., TIME-RESOLVED DETECTION OF PARTICLE REMOVAL FROM DIELECTRICS ON FEMTOSECOND LASER-ABLATION, Applied surface science, 129, 1998, pp. 76-80
Citations number
11
Categorie Soggetti
Physics, Applied","Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
The dynamics of the ablation process in different oxides (amorphous an
d crystalline quartz. sapphire and MgO) after intensive lasts excitati
on was studied by a combination of the femtosecond pump-probe techniqu
e with optical surface scattering. A 120-fs laser pulse (lambda = 800
nm) was focused onto the sample with a fluence at least twice the sing
le-shot surface damage threshold. A much weal;er probe laser pulse opt
ically aligned collinear to the pump beam illuminated the excited area
at variable delay times up to 100 ps. We observe a material dependent
increase in the scattering signal after a certain delay time which we
interpret as the onset of the ablation process. This occurs much earl
ier for amorphous and crystalline silica than for sapphire or MgO, as
a consequence of differences in the electron-phonon coupling strength.
The morphology of the irradiated spot on sapphire, amorphous and crys
talline quartz is indicative of melting and vaporisation in contrast t
o that on MgO which clearly shows fracturing. (C) 1998 Elsevier Scienc
e B.V.