FEMTOSECOND LASER-ABLATION OF SAPPHIRE - TIME-OF-FLIGHT ANALYSIS OF ABLATION PLUME

Citation
H. Varel et al., FEMTOSECOND LASER-ABLATION OF SAPPHIRE - TIME-OF-FLIGHT ANALYSIS OF ABLATION PLUME, Applied surface science, 129, 1998, pp. 128-133
Citations number
9
Categorie Soggetti
Physics, Applied","Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
Journal title
ISSN journal
01694332
Volume
129
Year of publication
1998
Pages
128 - 133
Database
ISI
SICI code
0169-4332(1998)129:<128:FLOS-T>2.0.ZU;2-S
Abstract
Time-of-flight mass spectrometry has been used to investigate the mass and velocity distributions of positive ions produced on laser ablatio n of sapphire with ultrashort (200 fs) laser pulses at a wavelength of 790 nm. Aluminium and oxygen ions were observed with the proportion o f singly and doubly charged oxygen ions increasing with increasing num ber of laser shots Fur a given laser fluence. The ions have extremely high kinetic energies which is attributed to Coulomb explosion from ch arged defect sites. (C) 1998 Elsevier Science B.V.