Tm. Dipalma et al., GAN THIN-FILM FABRICATION BY REACTION OF LASER EVAPORATED GA AND GAASIN NH3 ATMOSPHERE, Applied surface science, 129, 1998, pp. 350-354
Citations number
29
Categorie Soggetti
Physics, Applied","Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
The III group element nitrides (AlN, GaN, InN) have been prepared by l
aser ablation of the metals and simultaneous exposure to NH3. This stu
dy reports the growth of polycrystalline thin films of GaN on Si(100)
by Nd:YAG (lambda = 532 nm) laser evaporation of bare Ga and GaAs in a
NH3 atmosphere. The key problems are the gas phase solvation mechanis
m leading to Ga(NH3)(n) cluster formation and to direct nitridation of
the target to yield GaN. Time of Right mass spectrometry has been use
d to monitor ablation plume components. The films were analyzed by con
ventional techniques, such as X-ray diffraction (XRD), scanning electr
on microscopy (SEM) and IR spectroscopy. (C) 1998 Elsevier Science B.V
.