F. Wellhofer et al., THE EFFECT OF SUBSTRATE-OFF-CUT ON THE PROPERTIES OF EPITAXIAL THIN-FILMS OF YBA2CU3O7-DELTA GROWN BY PULSED-LASER DEPOSITION, Applied surface science, 129, 1998, pp. 525-530
Citations number
12
Categorie Soggetti
Physics, Applied","Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
We have investigated the properties of a series of YBCO thin films of
230 nm thickness deposited onto SrTiO3 substrates (001) with a vicinal
off-cut angle between 0 degrees and 6 degrees in steps of 1 degrees.
RBS angular scans demonstrate the high degree of alignment between the
[100] direction of the substrate and the c-axis of the films at all a
ngles, and minimum yield values, chi(min), between 3 and 5% confirm th
e good crystallinity throughout the series. STM-images reveal signific
ant changes in the surface morphology of the YBCO-films with increasin
g vicinal angle, the film deposited onto the 1 degrees substrate showi
ng the smoothest surface. The analysis of the critical current densiti
es from VSM-measurements indicates an overall trend towards decreasing
current densities with increasing vicinal off-cut at 4.2 K but increa
sing at 77 K. We interpret this as a change in the dominant trapping r
egimes at high and low temperature. Pre-annealing the substrates in fl
owing oxygen results in a visible vicinal step-structure on the surfac
e of the substrates which may enable closer control of the microstruct
ure of such films. (C) 1998 Elsevier Science B.V.