Ti1-xNiHfx shape memory alloy thin films with Hf content up to 13.33 a
t.% were fabricated using a KrF excimer laser ablation system with dif
ferent composite targets in high vacuum for the first rime. As-deposit
ed amorphous Ti36.63Ni50.04Hf13.33 thin film was annealed for crystall
ization. The phase transformation behaviors of the thin film were char
acterized by differential scanning calorimetry. Both the heating and c
ooling curves exhibited double endotherms and exotherms indicating the
presence of R-phase during the phase transformation. The forward mart
ensitic transformation temperature is 31 degrees C, which is consisten
t with the co-existence of high-temperature parent phase (austenite) a
nd the low-temperature phase (martensite) at room temperature. The low
er transition temperatures of the thin film compared with that of bulk
material with the same composition was attributed to the refined grai
n size and the Ni content, which was slightly above 50 at%. The fabric
ation of TiNiHf shape memory alloy thin films by pulsed laser depositi
on will contribute to the successful development of microactuators. (C
) 1998 Elsevier Science B.V.