F. Cervelli et al., IN-SITU DIAGNOSTICS OF PULSED-LASER ABLATION THROUGH ATOMIC OXYGEN ABSORPTION-SPECTROSCOPY, Applied surface science, 129, 1998, pp. 679-685
Citations number
27
Categorie Soggetti
Physics, Applied","Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
We present an in situ diagnostics for time-and space-resolved analysis
of atomic oxygen during pulsed laser ablation in the presence of a mo
lecular oxygen environment. Our diagnostics are based on transient ato
mic absorption spectroscopy and exploits diode laser as the probe sour
ce. The results, acquired during ablation of YBCO and NiTi targets, de
monstrate the sensitivity of the technique in detecting the atomic oxy
gen produced through dissociation of O-2 environment gas, and show the
formation of a relatively large density of atomic oxygen close to the
plume range in the experimental conditions typical for deposition of
superconductive thin films. (C) 1998 Elsevier Science B.V.