Diamond thin films promise excellent performance in several applicatio
n fields such as high-temperature and high-frequency electronics, prot
ective coatings for components exposed to aggressive ambient condition
s, and electrode materials in electrochemistry. However, these interes
ting perspectives are presently limited by the polycrystalline morphol
ogy of deposited films that include a noticeable surface roughness and
the presence of pinholes. The objectives of this work are to get a de
eper understanding of the interactions and effects of intense radiatio
n on wide band gap materials, and to explore the conditions that may b
etter smooth the surface roughness and fill the pinholes. A comparison
is made between the effects induced on HF-CVD deposited diamond films
by radiation of energy values larger (ArF, lambda = 193 nm, h nu cong
ruent to 6.4 eV) and smaller(Nd:YAG, lambda = 532 nm, h nu congruent t
o 2.3 eV) than the electronic energy gap (h nu congruent to 5.4 eV). T
hese are analyzed by SEM and Raman spectroscopy. The radiation of the
Nd:YAG laser leaves the diamond thin film largely unaffected and is hi
ghly absorbed by the silicon substrate. The ArF laser radiation, on th
e other hand, shows a much larger absorption, probably associated with
an electronic transition from the valence band to the vacuum, which c
annot be performed at first order by electronic transitions induced by
Nd:YAG radiation. (C) 1998 Elsevier Science B.V.