Increases as large as 0.036-0.038 in the refractive index of fused sil
ica induced by multi-wavelength irradiation of substrates by vacuum-ul
traviolet (VUV) light emitted from a VUV Raman laser are reported, The
index change is ascribed to photoinduced decomposition of Si-O bonds
in fused silica by the VUV beam irradiation. The modified areas are pr
actically invisible in optical microscope and atomic force microscope
observations. The modified depth is estimated to be about 0.53-0.62 mu
m. Efficient phase gratings are created by illuminating the substrate
s through periodically patterned contact masks. (C) 1998 Elsevier Scie
nce B.V.