Femtosecond laser pulses at 790 and 395 nm combined with a scanning ga
lvo mirror system have allowed the ablation of high quality microchann
els in Pyrex, fused silica and silicon (100) for microchemical applica
tions. While Pyrex and fused silica can be micromachined in the near i
nfrared or UV, silicon can only be micromachined to the required depth
s of similar to 50 mu m in the near UV where the linear absorption coe
fficient is much higher. Residual roughness on these materials is < 1
mu m. (C) 1998 Elsevier Science B.V.