FEMTOSECOND LASER MICROSTRUCTURING OF MATERIALS

Citation
S. Ameerbeg et al., FEMTOSECOND LASER MICROSTRUCTURING OF MATERIALS, Applied surface science, 129, 1998, pp. 875-880
Citations number
14
Categorie Soggetti
Physics, Applied","Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
Journal title
ISSN journal
01694332
Volume
129
Year of publication
1998
Pages
875 - 880
Database
ISI
SICI code
0169-4332(1998)129:<875:FLMOM>2.0.ZU;2-F
Abstract
Femtosecond laser pulses at 790 and 395 nm combined with a scanning ga lvo mirror system have allowed the ablation of high quality microchann els in Pyrex, fused silica and silicon (100) for microchemical applica tions. While Pyrex and fused silica can be micromachined in the near i nfrared or UV, silicon can only be micromachined to the required depth s of similar to 50 mu m in the near UV where the linear absorption coe fficient is much higher. Residual roughness on these materials is < 1 mu m. (C) 1998 Elsevier Science B.V.