S. Grigull et al., TRANSPORT AND STRUCTURAL MODIFICATION DURING NITROGEN IMPLANTATION OFHARD AMORPHOUS-CARBON FILMS, Journal of applied physics, 83(10), 1998, pp. 5185-5194
Hard amorphous carbon (ta-C) films were implanted with 20 keV N+ ions
with different fluences up to 6 X 10(17)/cm(2) at different substrate
temperatures. The nitrogen content of the films was monitored in situ
using elastic recoil detection analysis, A characteristic temperature
dependence is observed for the maximum achievable [N]/[C] composition
ratio, with a drop of the saturation level from the room-temperature v
alue of 0.35 to 0.17-0.12 above 150 degrees C. It is shown that the hi
gher nitrogen retention at room temperature is correlated with the for
mation of N-2-containing gas bubbles which are not present in samples
implanted with high fluences at elevated temperatures. From residual-g
as analyses it is found that nitrogen is reemitted from the films main
ly as N-2 when saturation occurs. Double-implantation experiments with
spatially separated N-14 and N-15 implanted regions, respectively, in
dicate that the N-N molecule recombination observed at large implantat
ion fluences occurs inside the films and not at the surface. Significa
nt changes of the microstructure of the films are found with increasin
g implantation fluences. Inside the implanted near-surface region of s
everal 10 nm thickness the density of the material decreases from,3.0
to about 1.7 g/cm(-3). Graphitic clusters are identified in samples im
planted up to saturation at 400 degrees C, using cross-section transmi
ssion electron microscopy. A basic approach to modeling the nitrogen s
aturation and release at large fluences is presented. Both nitrogen re
lease and structural modification processes are interpreted as a tende
ncy towards thermodynamic equilibrium which may constitute a strong dr
iving force against the synthesis of nitrogen-rich hard C:N materials,
compared to other nitride phases. (C) 1998 American Institute of Phys
ics.