KINETICS AND CHARACTERIZATION OF PLASMA GROWN ALUMINUM-OXIDE

Citation
S. Four et al., KINETICS AND CHARACTERIZATION OF PLASMA GROWN ALUMINUM-OXIDE, Journal of applied physics, 83(10), 1998, pp. 5570-5572
Citations number
16
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
83
Issue
10
Year of publication
1998
Pages
5570 - 5572
Database
ISI
SICI code
0021-8979(1998)83:10<5570:KACOPG>2.0.ZU;2-S
Abstract
The anodization of aluminium in a microwave excited O-2 plasma has bee n studied at temperatures less than 100 degrees C. Thirty nanometers o f oxide were grown in times substantially less than one hour. The grow th kinetics follow those expected using the constant current growth mo de. X-ray diffraction, Fourier transform infrared absorption, X-ray ph otoelectron spectroscopy, Auger electron spectroscopy, and electrical studies were carried out. The oxide is amorphous and stoichiometric, t he as-grown films have high electrical conductivity. The method may be well suited for the formation of protective coatings. (C) 1998 Americ an Institute of Physics.