CONTROL AND OBSERVATION STRUCTURES FOR ANALOG CIRCUITS

Authors
SHIEH YR WU CW
Citation
Yr. Shieh et Cw. Wu, CONTROL AND OBSERVATION STRUCTURES FOR ANALOG CIRCUITS, IEEE design & test of computers, 15(2), 1998, pp. 56-64
Citations number
12
Categorie Soggetti
Computer Science Hardware & Architecture","Computer Science Hardware & Architecture
Journal title
IEEE design & test of computers → ACNP
ISSN journal
07407475
Volume
15
Issue
2
Year of publication
1998
Pages
56 - 64
Database
ISI
SICI code
0740-7475(1998)15:2<56:CAOSFA>2.0.ZU;2-E
Abstract
No previously proposed analog built-in self-test method allows simulta neous control of all test points, the basic diagnosis capability requi red for analog circuits. Here is an approach that allows observation a nd control of DC voltage levels of all test points simultaneously, wit h a calibration process that ensures accuracy.