ELLIPSOMETRIC INVESTIGATIONS OF PIEZO-OPTICAL EFFECTS

Citation
M. Cardona et al., ELLIPSOMETRIC INVESTIGATIONS OF PIEZO-OPTICAL EFFECTS, Thin solid films, 313, 1998, pp. 10-17
Citations number
25
Categorie Soggetti
Physics, Applied","Material Science","Physics, Condensed Matter
Journal title
ISSN journal
00406090
Volume
313
Year of publication
1998
Pages
10 - 17
Database
ISI
SICI code
0040-6090(1998)313:<10:EIOPE>2.0.ZU;2-S
Abstract
An introduction to the stress-induced birefringence of solids, with em phasis on cubic and amorphous materials, is given. Most available expe rimental data have been obtained in the frequency region below the ele ctronic absorption edge: the corresponding coefficients of the stress- optical tensor are then real. Above the edge (and also in the IR regio n of the Reststrahlen) they become complex. Ellipsometry is an excelle nt tool for the investigation of complex stress-optical functions. It also yields the hydrostatic pressure induced changes in the dielectric functions. Data obtained recently for diamond and zincblende-type cry stals and their theoretical interpretation are discussed. (C) 1998 Els evier Science S.A.