An introduction to the stress-induced birefringence of solids, with em
phasis on cubic and amorphous materials, is given. Most available expe
rimental data have been obtained in the frequency region below the ele
ctronic absorption edge: the corresponding coefficients of the stress-
optical tensor are then real. Above the edge (and also in the IR regio
n of the Reststrahlen) they become complex. Ellipsometry is an excelle
nt tool for the investigation of complex stress-optical functions. It
also yields the hydrostatic pressure induced changes in the dielectric
functions. Data obtained recently for diamond and zincblende-type cry
stals and their theoretical interpretation are discussed. (C) 1998 Els
evier Science S.A.