Fk. Urban et D. Barton, TOWARD A-PRIORI SELECTION OF ELLIPSOMETRY ANGLES AND WAVELENGTHS USING A HIGH-PERFORMANCE SEMANTIC DATABASE, Thin solid films, 313, 1998, pp. 119-123
Modern ellipsometers only barely resemble those of only a decade ago.
In situ measurements are commonly spectroscopic and ex situ investigat
ions frequently add an additional variable, incidence angle. In either
case, the number of measurements for an analysis can be 10000 or more
. Experience in a recent international round robin experiment showed n
o particular agreement in the selection of angles and wavelengths. Sel
ecting a fewer number of 'good' angles of incidence and wavelengths is
important because at the same time it would reduce the measurement ti
me, reduce computational load and improve the solutions. Currently we
choose to say 'good' points have high 'resolution' (a change in the de
sired parameter results in a measurable change in measured parameters)
and a solvable 'condition' (the inverse Hessian matrix is well condit
ioned for variably damped least squares). In this work, values of reso
lution and condition are simulated for approximately 1000 points in wa
velength-angle space for a large number of sample configurations and m
aterials (over 10000). These results are stored in a high performance
semantic database which can be more than a Gigabyte. Three-dimensional
images of the data and movies over thickness, for example, can be pul
led from the database in real time allowing selection of incidence ang
les and wavelengths for an analysis. (C) 1998 Published by Elsevier Sc
ience S.A.