B. Johs et al., DEVELOPMENT OF A PARAMETRIC OPTICAL-CONSTANT MODEL FOR HG1-XCDXTE FORCONTROL OF COMPOSITION BY SPECTROSCOPIC ELLIPSOMETRY DURING MBE GROWTH, Thin solid films, 313, 1998, pp. 137-142
The development of an optical constant library for Hg1-xCdxTe as a fun
ction of composition (x = 0-0.5) and temperature (T=0-250 degrees C) w
hich is suitable for precise composition control by spectroscopic elli
psometry (SE) during MBE growth is described. An efficient methodology
for acquiring in situ optical constants as a function of composition
and temperature is first presented. Optical constants extracted from t
hese in situ measurements, as well as literature data from room temper
ature values, were used to obtain internally Kramers-Kronig consistent
parametric optical constant models at discrete compositions and tempe
ratures. Then a global data analysis over temperature 'T' and composit
ion 'x' was performed in which the internal parameters of the optical
constant model were fitted as polynomials in T and x. This parametric
model was developed to replace, without compromising the quality of el
lipsometric data fits, the usual tabulated optical constant lists whil
e using a reasonably small set of adjustable parameters. The model is
flexible enough to describe the complicated critical point structures
of semiconductors, yet stable enough to generate optical constants as
a function of composition and temperature and permit limited extrapola
tion outside the measured range. (C) 1998 Elsevier Science S.A.