Dielectric lead lanthanum zirconate titanate thin films have been grow
n on Si(111) substrates by sol-gel processing. The composition of the
films is stoichiometric 9/65/35. When annealed at 450 degrees C, the f
ilms were found to be amorphous. The refractive index and the extincti
on coefficient of the films were measured in the spectral range of 1.8
-5.5 eV for the first time by photometric spectroellipsometry. The abs
orption edge is determined at about 3.7 eV. (C) 1998 Elsevier Science
S.A.