Dw. Thompson et al., DETERMINATION OF OPTICAL ANISOTROPY IN CALCITE FROM ULTRAVIOLET TO MIDINFRARED BY GENERALIZED ELLIPSOMETRY, Thin solid films, 313, 1998, pp. 341-346
Generalized (Jones matrix) ellipsometry is gaining considerable intere
st because of its ability to determine properties of anisotropic sampl
es. Herl, the strong uniaxial anisotropy of calcite (calcium carbonate
) was investigated using generalized ellipsometry. The wavelength rang
e from 0.73 to 6.5 eV (190 nm to 1.7 mu m) was covered using a standar
d variable angle spectroscopic ellipsometer; from 0.089 to 0.68 eV (1.
8-14 mu m), using a similar instrument based on a Fourier transform sp
ectrometer, Measurements were made on a single air-calcite interface f
or which the optic axis lay nominally in the plane of the surface, To
determine the optical constants and orientation of cut, both the angle
of incidence and rotation of the sample about its surface normal were
varied. Properties of the sample were arrived at by optimizing the pa
rameters of a material model such that the calculated normalized Jones
matrix elements best matched the measured ones. Localized spectral re
gions of absorption due to the internal vibrational modes of the carbo
nate ions were observed in the infrared at energies which differed for
the ordinary and extraordinary optical constants. The certainty to wh
ich sample properties could be determined was maximized by judicious c
hoice of measurement configurations. (C) 1998 Elsevier Science S.A.