SPECTRAL-ELLIPSOMETRIC INVESTIGATIONS ON SEMICONDUCTOR RESONATORS

Authors
Citation
G. Jungk, SPECTRAL-ELLIPSOMETRIC INVESTIGATIONS ON SEMICONDUCTOR RESONATORS, Thin solid films, 313, 1998, pp. 594-598
Citations number
14
Categorie Soggetti
Physics, Applied","Material Science","Physics, Condensed Matter
Journal title
ISSN journal
00406090
Volume
313
Year of publication
1998
Pages
594 - 598
Database
ISI
SICI code
0040-6090(1998)313:<594:SIOSR>2.0.ZU;2-V
Abstract
The linear optical response of semiconductor microcavities with embedd ed quantum wells has been investigated by ellipsometry and reflectivit y in the range of the stop-hand including the resonator mode. The expe rimental results are compared with calculated spectra using the transf er-matrix technique. The comparison confirms the effective metal-like behaviour of this non-absorptive system as well as the sensitivity of the response against small variations of the transition energy and pos ition of the quantum wells. The dielectric function of simple Bragg-re flectors and complete resonator structures are presented followed by t he discussion of the observed mode splitting of the reflectivity spect ra. (C) 1998 Elsevier Science S.A.