SPECTROSCOPIC ELLIPSOMETRY OF FULLERENE EMBEDDED LANGMUIR-BLODGETT-FILMS WITH SURFACE-PLASMON EXCITATION

Authors
BORTCHAGOVSKY E YURCHENKO I KAZANTSEVA Z HUMLICEK J HORA J
Citation
E. Bortchagovsky et al., SPECTROSCOPIC ELLIPSOMETRY OF FULLERENE EMBEDDED LANGMUIR-BLODGETT-FILMS WITH SURFACE-PLASMON EXCITATION, Thin solid films, 313, 1998, pp. 795-798
Citations number
11
Categorie Soggetti
Physics, Applied","Material Science","Physics, Condensed Matter
Journal title
Thin solid films → ACNP
ISSN journal
00406090
Volume
313
Year of publication
1998
Pages
795 - 798
Database
ISI
SICI code
0040-6090(1998)313:<795:SEOFEL>2.0.ZU;2-C
Abstract
This work presents the first results of an ellipsometric investigation of fullerene embedded Langmuir-Blodgett films with surface plasmon ex citation. In contrast to standard ellipsometry, the angle Delta obtain ed in this way has pronounced features observed at the C-60 transition s. (C) 1998 Elsevier Science S.A.