M. Nespolo et al., REPRESENTATION OF THE AXIAL SETTINGS OF MICA POLYTYPES, Acta crystallographica. Section A, Foundations of crystallography, 54, 1998, pp. 348-356
The basic unit of mica polytypes has monoclinic symmetry and the layer
stagger is a submultiple of the periodicity along the a axis. Because
of these features, more than one suitable axial setting can be chosen
for non-orthogonal micas. Three types of axial settings are introduce
d and shown to be useful for classifying non-orthogonal polytypes of m
icas and indexing their diffraction patterns. Standard setting is the
axial setting of a polytype leading to the shortest projection of the
c axis onto the (001) plane. Basic axial setting is the standard setti
ng of a polytype with a number N of layers equal to an integral multip
le of 3(n). All the polytypes having the same basic axial setting belo
ng to the same Series. Fixed-angle setting is the axial setting of a g
eneral polytype showing the same angle as the corresponding basic axia
l setting. The total layer stagger of stacking classifies polytypes in
to two Classes: their c axis is inclined towards respectively the shor
test (Class a) or the longest (Class b) of the two orthohexagonal axes
in the plane of the layer. Each Class is further divided according to
N = 1 (mod 3) (Subclass1) and N = 2 (mod 3) (Subclass 2). By expressi
ng N as 3(n)(3K + L), the two integers n and L (1 or 2) establish the
Series and the Subclass, respectively. This definition allows an effec
tive classification of the polytypes and a systematic approach to the
indexing of diffraction patterns, independently of their complexity, w
hich increases with N. The transformation rules between settings are g
iven and examples are discussed.