CONSISTENT SYMMETRICAL AXIS METHOD FOR ROBUST-DETECTION OF ELLIPSES

Ellipse detection is an interesting issue in machine vision researches and many approaches have been suggested to determine the parameters. Recently, a symmetric axis method has been proposed to determine the c entre of an ellipse, but other parameters are determined otherwise. A consistent symmetric axis method is proposed that utilises the informa tion inherent in the symmetric axes throughout the entire process to c ompute all of the parameters. A closed-form solution is obtained. henc e the calculation of the parameters is fast. In addition, since the de termination of the symmetric axes involves a set of points on the elli pse, the procedure is robust. Experiments with disjoint ellipses, inte racting ellipses, defective ellipses and real objects indicate the eff ectiveness of the proposed method both theoretically and practically.