COMPLEX GENERAL FOURIER VARIATIONAL METHOD APPLIED TO THE ANALYSIS OFSEMICONDUCTOR-LASERS

Authors
NOUREDDINE M BENSON TM SMARTT CJ KENDALL PC
Citation
M. Noureddine et al., COMPLEX GENERAL FOURIER VARIATIONAL METHOD APPLIED TO THE ANALYSIS OFSEMICONDUCTOR-LASERS, IEE proceedings. Optoelectronics, 144(4), 1997, pp. 241-245
Citations number
23
Journal title
IEE proceedings. Optoelectronics → ACNP
ISSN journal
13502433
Volume
144
Issue
4
Year of publication
1997
Pages
241 - 245
Database
ISI
SICI code
1350-2433(1997)144:4<241:CGFVMA>2.0.ZU;2-E
Abstract
The generalised Fourier variational (GFV) method is implemented for th e analysis of optoelectronic structures incorporating two new features : multiple layers and complex refractive indices. This extended method is validated by calculating complex propagation constants for commonl y occurring types of index-guided laser geometries. The method produce s highly accurate complex results by simple means, and is very fast.