SEMICONDUCTOR-LASER LINEWIDTH FROM THE TRANSMISSION-LINE LASER MODEL

Two methods for determining semiconductor laser linewidth using the tr ansmission-line laser model (TLLM) are developed. The first is a semia nalytical method suitable for DFB lasers, The second uses Fourier tran sforms to extract the laser spectrum from the simulated optical field, and is suitable for any laser structure. A technique for increasing t he accuracy of this second method has been developed. Extensive compar isons with previous work verify the accuracy of both methods.