The oxidation behavior of a nanolayered MoSi2/SiC composite material w
as determined at the temperature range of 400-900 degrees C in wet oxi
dation conditions. The samples were produced in the form of thin films
using a sputtering technique from two different sources, and a rotati
ng substrate holder, onto silicon single crystals and low carbon steel
. For comparison, the oxidations of both constituents, MoSi2 and SiC,
produced with the same sputtering technique, were measured separately.
The microstructure of the MoSi2/SiC samples was determined with high
resolution transmission electron microscopy (HRTEM), and the compositi
on of the sputtered samples was measured using backscattering (BS) of
protons. For quantitative determination of oxidation, the nuclear reac
tion O-16(d, p)O-17 was utilized. Oxide layers were also analyzed usin
g a secondary ion mass spectrometry (SIMS) and the appearance of the o
xidized surface with a scanning electron microscopy (SEM). As expected
, the SiC films had both the lowest initial oxidation and steady state
oxidation rate. The results show that the oxidation behavior of the M
oSi2/SiC nanolayered composite material differs from that of both its
constituents and involves a degradation mechanism of its own, resultin
g in the highest oxidation during the initial phase of the oxidation.
A steady-state oxidation rate was observed after the initial transient
phase to be the highest for the metastable C40 structure of the singl
e MoSi2 layer. The oxidation rate of the nanolayered structure was ret
arded by the SiC layers. No signs of pest disintegration were observed
on either of the MoSi2 containing coatings during the steady-state ph
ase of the oxidation at 500 degrees C up to 40 h. Our results show tha
t the oxidation of nanolayered structures can be only in part explaine
d by the oxidation behavior of the constituents and that during the st
eady-state oxidation of the nanolayered structure the oxidation rate i
s largely determined by the constituent with the lowest oxidation rate
and by the layered structure.