HYDROGEN-SURFACTANT MEDIATED GROWTH OF GE ON SI(001)

Citation
Sj. Kahng et al., HYDROGEN-SURFACTANT MEDIATED GROWTH OF GE ON SI(001), Physical review letters, 80(22), 1998, pp. 4931-4934
Citations number
31
Categorie Soggetti
Physics
Journal title
ISSN journal
00319007
Volume
80
Issue
22
Year of publication
1998
Pages
4931 - 4934
Database
ISI
SICI code
0031-9007(1998)80:22<4931:HMGOGO>2.0.ZU;2-A
Abstract
The role of hydrogen in the growth of Ge on a Si(001)-(2 X I) surface was studied by scanning tunneling microscopy and medium energy ion sca ttering spectroscopy. The adsorbed hydrogen was found to (i) increase the number of equilibrium adsorption sites, (ii) lift the diffusion an isotropy, and (iii) lower the diffusivity for Ge adatom, as suggested by the recent first principle calculation. With a dynamically supplied atomic hydrogen flux of similar to 2 monolayers/s, we achieved layer- by-layer growth by preventing growth of the hut cluster beyond the kno wn critical thickness. The 10.0 monolayer Ge layers grown with hydroge n surfactant are strained, while those without it are relaxed.