DENSITY-DEPENDENCE OF THE EXCITON ENERGY IN SEMICONDUCTORS

Citation
G. Manzke et al., DENSITY-DEPENDENCE OF THE EXCITON ENERGY IN SEMICONDUCTORS, Physical review letters, 80(22), 1998, pp. 4943-4946
Citations number
26
Categorie Soggetti
Physics
Journal title
ISSN journal
00319007
Volume
80
Issue
22
Year of publication
1998
Pages
4943 - 4946
Database
ISI
SICI code
0031-9007(1998)80:22<4943:DOTEEI>2.0.ZU;2-3
Abstract
We investigate both experimentally and theoretically the excitonic abs orption in ZnSe in a temperature range between 2 and 60 K with increas ing densities of carriers. For higher temperatures a weak redshift of the exciton resonance is found which turns into a blueshift for lower temperatures. While the widely used simplified treatment of the scatte ring processes within a static screening approximation fails completel y to describe this thermally induced crossover, it can be explained by the interplay between Coulomb-Hartree-Fock renormalizations and carri er-carrier and carrier-polarization scattering including the dynamical screening.