ACCUMULATION LAYER AND INTERFACE EFFECTS IN DOPED NONABRUPT GAAS ALXGA1-XAS SINGLE QUANTUM-WELLS/

Citation
Ak. Freire et al., ACCUMULATION LAYER AND INTERFACE EFFECTS IN DOPED NONABRUPT GAAS ALXGA1-XAS SINGLE QUANTUM-WELLS/, Superlattices and microstructures, 23(5), 1998, pp. 1015-1018
Citations number
10
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
07496036
Volume
23
Issue
5
Year of publication
1998
Pages
1015 - 1018
Database
ISI
SICI code
0749-6036(1998)23:5<1015:ALAIEI>2.0.ZU;2-F
Abstract
The electron energy levels in doped nonabrupt GaAs/AlxGa1-xAs single q uantum wells 100 Angstrom wide are calculated. Interface widths varyin g from zero to four GaAs unit cells are taken into account, as well as band bendings of 0-90 meV. It is shown that interface effects on the energy levels are important and sensitive to the level of doping. When interfaces of only two GaAs unit cells and a band bending of 40 meV a re considered, the ground-state (first excited state) energy level shi fts toward energies as high as 4 meV (20 meV). (C) 1998 Academic Press Limited.