ULTRAFAST STRUCTURAL-CHANGES MEASURED BY TIME-RESOLVED X-RAY-DIFFRACTION

Citation
J. Larsson et al., ULTRAFAST STRUCTURAL-CHANGES MEASURED BY TIME-RESOLVED X-RAY-DIFFRACTION, Applied physics A: Materials science & processing, 66(6), 1998, pp. 587-591
Citations number
38
Categorie Soggetti
Physics, Applied
ISSN journal
09478396
Volume
66
Issue
6
Year of publication
1998
Pages
587 - 591
Database
ISI
SICI code
0947-8396(1998)66:6<587:USMBTX>2.0.ZU;2-A
Abstract
High-intensity X-ray pulses from third-generation synchrotron sources make it possible to study the temporal dynamics of rapidly evolving ma terials. We report a study of rapid and reversible disordering of the structure of an InSb crystal induced by an ultrashort laser pulse. A n ovel crosscorrelation detection technique is described, which allowed us to observe rapid changes in X-ray diffraction that occur on a time- scale of less than 2 ps.