P. Markiewicz et Mc. Goh, ATOMIC-FORCE MICROSCOPY PROBE TIP VISUALIZATION AND IMPROVEMENT OF IMAGES USING A SIMPLE DECONVOLUTION PROCEDURE, Langmuir, 10(1), 1994, pp. 5-7
A simple numerical procedure for separating the probe tip from images
obtained by atom;e force microscopy (AFM) is presented. The importance
of this is 2-fold: first, it provides a way of visualizing the probe
tip in a nondestructive manner, which is useful in eliminating artifac
ts; second, it enables the deconvolution of the probe tip from the ima
ge, resulting in a more accurate picture of the sample. Examples of de
convolution using both an idealized tip and a real tip are given. Such
a quick and effective procedure enables incorporating the visualizati
on of AFM tips as a daily routine.