B. Bhushan, MICRO NANOTRIBOLOGY USING ATOMIC-FORCE MICROSCOPY/FRICTION FORCE MICROSCOPY - STATE-OF-THE-ART/, Proceedings of the Institution of Mechanical Engineers, Part J, Journal of engineering tribology, 212(J1), 1998, pp. 1-18
Atomic force microscopy/friction force microscopy (AFM/FFM) techniques
are increasingly used for tribological studies of engineering surface
s at scales ranging from atomic and molecular to microscales. These te
chniques have been used to study surface roughness, adhesion, friction
, scratching/wear, indentation, detection of material transfer and bou
ndary lubrication and for nanofabrication/nanomachining purposes. Micr
o/nanotribological studies of materials of scientific and engineering
interest have been conducted. Commonly measured roughness parameters a
re found to be scale dependent, requiring the need of scale-independen
t fractal parameters to characterize surface roughness. Measurement of
atomic-scale friction of a freshly cleaved highly orientated pyrolyti
c graphite exhibited the same periodicity as that of corresponding top
ography. However, the peaks in friction and those in corresponding top
ography were displaced relative to each other. Variations in atomic-sc
ale friction and the observed displacement have been explained by the
variations in interatomic forces in the normal and lateral directions.
Local variation in microscale friction is found to correspond to the
local slope, suggesting that a ratchet mechanism is responsible for th
is variation. Directionality in the friction is observed on both micro
- and macroscales which results from the surface preparation and aniso
tropy in surface roughness. Microscale friction is generally found to
be smaller than macroscale friction as there is less ploughing contrib
ution in microscale measurements. Microscale friction is load dependen
t and friction values increase with an increase in the normal load app
roaching the macrofriction at contact stresses higher than the hardnes
s of the softer material. The wear rate for single-crystal silicon is
negligible below 20 mu N and is much higher and remains approximately
constant at higher loads. Elastic deformation at low loads is responsi
ble for negligible wear. The mechanism of material removal on a micros
cale is studied. At the loads used in the study, material is removed b
y the ploughing mode in a brittle manner without much plastic deformat
ion. Most of the wear debris is loose. Evolution of the wear has also
been studied using AFM. Wear is found to be initiated at nanoscratches
. AFM has been modified to obtain load-displacement curves and for mea
surement of nanoindentation hardness and Young's modulus of elasticity
, with the depth of indentation as low as 1 nm. Hardness of ceramics o
n the nanoscale is found to be higher than that on the microscale. Cer
amics exhibit significant plasticity and creep on the nanoscale. Scrat
ching and indentation on nanoscales are powerful ways to screen for ad
hesion and resistance to deformation of ultra-thin films. Detection of
material transfer on the nanoscale is possible with AFM. Boundary lub
rication studies and measurement of lubricant-film thickness with a la
teral resolution on a nanoscale have been conducted using AFM. Self-as
sembled monolayers and chemically bonded lubricant films with a mobile
fraction are superior in wear resistance. Friction and wear on micro-
and nanoscales at low loads have been found to be generally smaller co
mpared to that at macroscales. Therefore, micro/nanotribological studi
es may help define the regimes for ultra-low friction and near-zero we
ar.