Gn. Batts et Aj. Paul, A STUDY OF THE COMPETITIVE ADSORPTION OF A FLUOROSURFACTANT AT THE GELATIN AIR INTERFACE USING TIME-OF-FLIGHT SECONDARY-ION MASS-SPECTROMETRY, Langmuir, 10(1), 1994, pp. 218-224
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) has been use
d to follow qualitatively and quantitatively the displacement of gelat
in by a fluorosurfactant from an interface over a wide concentration r
ange from zero to beyond monolayer coverage of the fluorosurfactant. T
he ToF-SIMS results are in good agreement with published wettability d
ata and also show a good correlation with previously reported measurem
ents using X-ray photoelectron spectroscopy (XPS). The ToF-SIMS result
s indicate no change in the outermost surface chemistry above the poin
t of monolayer coverage as defined according to the Gibbs adsorption m
odel and that the surface displacement of gelatin by the fluorosurfact
ant is effectively complete.