SIMS studies of the effect of H at interfaces formed by oxidized zirconium

Secondary ion mass spectrometry (SIMS) has been used to guide the search fo r an oxidation procedure that can produce a thin and relatively sharp oxide layer on macroscopic zirconium. A new preparation based on dip coating in H2O2 solution is indicated to be suitable for this purpose. SIMS further in dicates that the oxide interface, for such a prepared sample, shows substan tial degradation when it is heated in H-2 gas at 300 degrees C. The presenc e of H appears to facilitate O migration into the metallic region, an obser vation that supplements those made previously on oxidized thin-film samples of zirconium prepared by deposition under ultrahigh-vacuum conditions.