In this paper, the theoretical analysis of the Auger mechanism in n(+)-p Ga
InAsSb infrared photovoltaic detectors is reported, The lifetime caused by
the Auger mechanism is calculated depending on the compositions, temperatur
e, and carrier concentration, We also analyze the effect of material parame
ters on the detectivity of the n(+)-p GaInAsSb detectors. The calculated re
sults show that the Auger mechanism could be suppressed by optimizing the m
aterial parameters, so that the performance of GaInAsSb infrared photovolta
ic detectors is improved.