Statistical texture characterization from discrete wavelet representations

Citation
G. Van De Wouwer et al., Statistical texture characterization from discrete wavelet representations, IEEE IM PR, 8(4), 1999, pp. 592-598
Citations number
30
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE TRANSACTIONS ON IMAGE PROCESSING
ISSN journal
10577149 → ACNP
Volume
8
Issue
4
Year of publication
1999
Pages
592 - 598
Database
ISI
SICI code
1057-7149(199904)8:4<592:STCFDW>2.0.ZU;2-T
Abstract
We conjecture that texture can be characterized by the statistics of the wa velet detail coefficients and therefore introduce two feature sets: 1) the wavelet histogram signatures which capture all first order statistics using a model based approach and 2) the wavelet co-occurrence signatures, which reflect the coefficients' second-order statistics. The introduced feature sets outperform the traditionally used energy, Best performance is achieved by combining histogram and eo-occurrence signatures .