Transmission x-ray microscopy with 50 nm resolution installed at Ritsumeikan Synchrotron Radiation Center

Authors
Hirai, A Takemoto, K Nishino, K Niemann, B Hettwer, M Rudolph, D Anderson, E Attwood, D Kern, DP Nakayama, Y Kihara, H
Citation
A. Hirai et al., Transmission x-ray microscopy with 50 nm resolution installed at Ritsumeikan Synchrotron Radiation Center, JPN J A P 1, 38(1A), 1999, pp. 274-278
Citations number
21
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS → ACNP
Volume
38
Issue
1A
Year of publication
1999
Pages
274 - 278
Database
ISI
SICI code
Abstract
A transmission X-ray microscope having two zone plates has been developed a t BL-12, Ritsumeikan Synchrotron Radiation Center (Rits SR Center). By inco rporating a new: type of condenser zone plate (diameter 9 mm, zone number41 ,890; outermost zone width 53.7 nm) in the microscope, 50 nm resolution has been obtained from both knife edge test and star test pattern at a wavelen gth of 3.2 nm, and for diatoms, the 0.1 mu m inner structures have been cle arly resolved.