Field emission microscopy of carbon nanotube caps

Citation
Ka. Dean et Br. Chalamala, Field emission microscopy of carbon nanotube caps, J APPL PHYS, 85(7), 1999, pp. 3832-3836
Citations number
21
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
85
Issue
7
Year of publication
1999
Pages
3832 - 3836
Database
ISI
SICI code
0021-8979(19990401)85:7<3832:FEMOCN>2.0.ZU;2-0
Abstract
We report field emission microscopy images from single walled carbon nanotu bes showing resolvable fine structure with five- and six-fold symmetry. We present evidence indicating that these images have atomic resolution and th at they depict the electronic structure of individual nanotube caps under h igh-field conditions. Fine structure is observed only after removal of surf ace adsorbates. Prior to adsorbate removal, these images show symmetrical l obed patterns and several other behaviors characteristic of chemisorbed res onant tunneling states. (C) 1999 American Institute of Physics. [S0021-8979 (99)05907-1].