A. Wieckowski et A. Kolics, Comments on 'On the calculation of surface concentration from the measurement by the radiotracer 'electrode lowering' technique' by D. Poskus, J ELEC CHEM, 464(1), 1999, pp. 118-122
Quantitative aspects of surface concentration measurements of radiolabeled
adsorbates by the thin-gap measuring technique developed by our group have
been discussed recently by Poskus (see D. Poskus, J. Electroanal. Chem. 442
1998 5). It was argued that surface concentrations obtained by us were und
erdetermined since the backscattering factor of beta-radiation used in our
work was too high versus a similar, but more recently obtained value by the
quoted author. In response, we have reanalyzed our measuring conditions wi
th a special emphasis on the backscattering phenomena involved in the exper
iment. Without contradicting the author's conclusions, the reported results
indicate that the backscattering factor used in our formula linking radiat
ion data and surface concentrations was correct, Apparently. in the scintil
lation-counter mode of the measurements, such a backscattering factor invol
ves a simultaneous detection of reflected light from scintillation events a
nd backscattered beta-radiation emitted by the radioactive preparate. Conve
rsely, the Poskus measurements conducted by the use of a gaseous counter de
termine the second component only. Using a new, experimentally determined b
ackscattering factor and a Au(111) electrode, we present a comparison betwe
en sulfate adsorption data obtained by the use of the thin-gap technique an
d Auger electron spectroscopy and prove, once again, the accuracy of our da
ta. (C) 1999 Elsevier Science S.A. All rights reserved.