Distribution of the crystal modifications in polymorphous PbSe films revealed by microhardness measurements

Authors
Baleva, M Mateeva, E Trifonova, EP
Citation
M. Baleva et al., Distribution of the crystal modifications in polymorphous PbSe films revealed by microhardness measurements, J MATER SCI, 34(4), 1999, pp. 795-799
Citations number
14
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF MATERIALS SCIENCE
ISSN journal
00222461 → ACNP
Volume
34
Issue
4
Year of publication
1999
Pages
795 - 799
Database
ISI
SICI code
0022-2461(19990215)34:4<795:DOTCMI>2.0.ZU;2-U
Abstract
Microhardness measurements of homogeneous and layered polymorphous PbSe fil ms as well of the KCl and BaF2 substrates on which the films were deposited were undertaken. The interpretation of the experimental results lead to a formula describing more adequately the indentation size effect. It is also shown that an extremum in the microhardness depth profile appears whenever the indentor crosses an interface. (C) 1999 Kluwer Academic Publishers.