Electrostatic self-assembly of highly-uniform micrometer-thick fullerene films

Authors
Liu, YJ Wang, YX Lu, HX Claus, RO
Citation
Yj. Liu et al., Electrostatic self-assembly of highly-uniform micrometer-thick fullerene films, J PHYS CH B, 103(12), 1999, pp. 2035-2036
Citations number
20
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
JOURNAL OF PHYSICAL CHEMISTRY B
ISSN journal
15206106 → ACNP
Volume
103
Issue
12
Year of publication
1999
Pages
2035 - 2036
Database
ISI
SICI code
1520-6106(19990325)103:12<2035:ESOHMF>2.0.ZU;2-I
Abstract
The layer-by-layer electrostatic self-assembly monolayer (ESAM) method has been successfully utilized to fabricate ultrathin multilayer films of fulle renes. Highly uniform, transparent, micrometer-thick fullerene films have b een fabricated and characterized by UV-vis spectroscopy, ellipsometry, and atomic force microscopy.