X-ray reflectivity study of the water-hexane interface

Citation
Dm. Mitrinovic et al., X-ray reflectivity study of the water-hexane interface, J PHYS CH B, 103(11), 1999, pp. 1779-1782
Citations number
31
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
JOURNAL OF PHYSICAL CHEMISTRY B
ISSN journal
15206106 → ACNP
Volume
103
Issue
11
Year of publication
1999
Pages
1779 - 1782
Database
ISI
SICI code
1520-6106(19990318)103:11<1779:XRSOTW>2.0.ZU;2-D
Abstract
Synchrotron X-ray reflectivity is used to study the electron density profil e normal to the bulk water-hexane interface. This first measurement of the microscopic interfacial width of a neat water-oil interface relied upon the development of a novel technique to flatten the liquid-liquid interface. T he measurement is interpreted in terms of an error function electron densit y profile to yield an interfacial width of 0.33 +/- 0.025 nm, Within the co ntext of capillary wave theory, it is shown that this microscopic parameter is in agreement with macroscopic measurements of the interfacial tension. These measurements are compared to computer simulations of water-alkane int erfaces.