Energy-filtered transmission electron microscopy (EFTEM) was used to examin
e the distribution of silicon as T-atoms in mesoporous MCM-41 molecular sie
ves. At nanometer-sized resolution, the Si distribution image derived from
electron energy loss spectroscopy (EELS) with Gatan imaging filter (GIF) wa
s found to be ordered and correlated well to the hexagonal array of the one
-dimensional channels of MCM-41. In addition, the pore-to-pore distance and
the wall thickness of MCM-41 (determined by Si distribution map) are in go
od agreement with those derived from X-ray diffraction and N-2 adsorption m
ethods. (C) 1999 Elsevier Science B.V. All rights reserved.