Band gap determination in thick films from reflectance measurements

Authors
Kumar, V Sharma, SK Sharma, TP Singh, V
Citation
V. Kumar et al., Band gap determination in thick films from reflectance measurements, OPT MATER, 12(1), 1999, pp. 115-119
Citations number
7
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
OPTICAL MATERIALS
ISSN journal
09253467 → ACNP
Volume
12
Issue
1
Year of publication
1999
Pages
115 - 119
Database
ISI
SICI code
0925-3467(199905)12:1<115:BGDITF>2.0.ZU;2-M
Abstract
Spectroscopic techniques are very useful for characterising semiconducting materials. We demonstrate here a new formulation and method for measuring t he energy band gap in thick films from the reflectance data. (C) 1999 Elsev ier Science B.V All rights reserved.